X

Metrology

Shanghai Optics is fully equipped with state-of-the-art measuring equipment in our metrology division. Our testing equipment is a key indicator of Shanghai Optic’s capability to produce and control the quality of the optical components and systems. We produce parts that are inspected and measured in accordance with MIL-SPEC to ensure they meet the exact specifications and optical performance our clients’ needs. All parts are shipped with inspection reports, material certificates and coating curves (if applicable).

Shanghai Optics’ metrology enables our quality control team to test part compliance based on various international measurement standards, covering almost all of the optical processing in production.

Shanghai Optics is committed to meeting our customers’ specifications and requirements starting from the procurement of raw materials. All orders are controlled and monitored in adherence to ISO: 9001 standards—from the incoming inspection of purchased materials to each step in the production process.

The raw materials that are needed in our production, including glass, metal, polishing materials, adhesive etc., are purchased strictly according to the customer’s original prints.

Shanghai Optics has set up procedures to ensure full traceability of the raw material batch from which any of our optical components were manufactured.

As a lead customer lens and optical component manufacturer with over 55 years of experience, Shanghai Optics fully understands the significance of metrology and its ability to inspect. This pursuit of higher inspection precision prompts Shanghai Optics to continue expanding its inspection equipment and metrology capabilities.

Shanghai Optics is currently equipped with numerous world-class high-precision measurement instruments, including:

  • TriOptics Image Master (MTF Testing)
  • Surface Mapping Microscope (surface micro-roughness)
  • ZYGO’s 6-inch VeriFire XP interferometer systems
  • Radius test benches
  • Optical assembly benches
  • 18-inch aperture Zygo Mark IV phase-measuring interferometers
  • Taylor Hobson Form Talysurf Contact Profilometer
  • 3-D Simulation Projectors
  • Spectrophotometer: lambda 900/SHIMADZU UV3600