45°Beamsplitter
- Substrate: fused silica, BK7
- Surface Figure: <λ/10 @ 632.8nm
- Surface Quality: 40-20
- Chamfer: 0.5mm, 45°
- Coating Material: Electron beam deposited dielectric: multi-layers
- Incident: 0°,45°
- Laser-Induced Damage Threshold: >5J/cm2 (1.06μm,1ns)
| Incident Angle | Wavelength (nm) | Separating | Tolerance | ||
| Tave/Rave | Tp/Rp | Tp/Rp | |||
| 45° | 510-500 | 50/50 | ±3% | ||
| 45° | 780 | 50/50 | ±3% | ||
| 45° | 632.8 | 50/50 | ±3% |
Dichroic Beamsplitter
- Substrate: fused silica, BK7
- Surface Figure: <λ/10 @ 632.8nm
- Surface Quality: 40-20
- Chamfer: 0.5mm, 45°
- Coating Material: Electron beam deposited dielectric: multi-layers
- Incident: 0°,
- Laser-Induced Damage Threshold: >5J/cm2 (1.06μm,1ns)
| Incident Angle | TWavelength (nm) | Transmission | RWavelength | Reflectance |
| 0° | 808 | >90% | 946 | >99.5% |
| 0° | 808 | >90% | 1064 | >99.5% |
| 0° | 808 | >90% | 1320 | >99.5% |
| 0° | 940 | >90% | 1030 | >99.5% |
Polarizing Beamsplitter Cubes
- Substrate fused: silica, BK7
- Surface Figure: <λ/10 @ 632.8nm
- Surface Quality: 40-20
- Chamfer: 0.5mm, 45°
- Coating Material: Electron beam deposited dielectric: multi-layers
- Incident:0°±2°
- Polarizing: Tp≥98%; Ts≤0.2%
- Extinction Ratio: Tp:Ts>500:1
- AR Coating: R<0.25%
| Wavelength (nm) |
| 632.8 |
| 780 |
| 830 |
| 852 |
| 1064 |
| 1310 |
| 1550 |
| 420-470 |
Polarizing Beamsplitter Plates
- Substrate fused: silica, BK7
- Surface Figure: <λ/10 @ 632.8nm
- Surface Quality: 40-20
- Chamfer: 0.5mm, 45°
- Coating Material: Electron beam deposited dielectric multi-layers
- Imcident Angle: 56.6°±3°
- Polarizing: Tp≥96%; Ts≤1%
- Extinction Ratio: Tp:Ts>100:1
- Wavelength Range: Visible, Near Infrared
| Wavelength (nm) | Wavelength (nm) |
| 20/25.4/30 | 780 |
| 20/25.4/30 | 1064 |
| 20/25.4/30 | 1310 |
| 20/25.4/30 | 1550 |
