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45°Beamsplitter

Substrate: fused silica, BK7
Surface Figure: <λ/10 @ 632.8nm
Surface Quality: 40-20
Chamfer: 0.5mm, 45°
Coating Material: Electron beam deposited dielectric: multi-layers
Incident: 0°,45°
Laser-Induced Damage Threshold: >5J/cm2 (1.06μm,1ns)

Incident Angle	Wavelength (nm)		Separating		Tolerance
		Tave/Rave	Tp/Rp	Tp/Rp
45°	510-500	50/50			±3%
45°	780		50/50		±3%
45°	632.8	50/50			±3%

Dichroic Beamsplitter

Substrate: fused silica, BK7
Surface Figure: <λ/10 @ 632.8nm
Surface Quality: 40-20
Chamfer: 0.5mm, 45°
Coating Material: Electron beam deposited dielectric: multi-layers
Incident: 0°,
Laser-Induced Damage Threshold: >5J/cm2 (1.06μm,1ns)

Incident Angle	TWavelength (nm)	Transmission	RWavelength	Reflectance
0°	808	>90%	946	>99.5%
0°	808	>90%	1064	>99.5%
0°	808	>90%	1320	>99.5%
0°	940	>90%	1030	>99.5%

Polarizing Beamsplitter Cubes

Substrate fused: silica, BK7
Surface Figure: <λ/10 @ 632.8nm
Surface Quality: 40-20
Chamfer: 0.5mm, 45°
Coating Material: Electron beam deposited dielectric: multi-layers
Incident:0°±2°
Polarizing: Tp≥98%; Ts≤0.2%
Extinction Ratio: Tp:Ts>500:1
AR Coating: R<0.25%

Wavelength (nm)
632.8
780
830
852
1064
1310
1550
420-470

Polarizing Beamsplitter Plates

Substrate fused: silica, BK7
Surface Figure: <λ/10 @ 632.8nm
Surface Quality: 40-20
Chamfer: 0.5mm, 45°
Coating Material: Electron beam deposited dielectric multi-layers
Imcident Angle: 56.6°±3°
Polarizing: Tp≥96%; Ts≤1%
Extinction Ratio: Tp:Ts>100:1
Wavelength Range: Visible, Near Infrared

Wavelength (nm)	Wavelength (nm)
20/25.4/30	780
20/25.4/30	1064
20/25.4/30	1310
20/25.4/30	1550

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